With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.
James R. Lloyd, Frederick G. Yost, Paul S. Ho ebooks downloads
Materials Reliability Issues in Microelectronics: Volume 225 (MRS Proceedings) pdf
Materials Reliability Issues in Microelectronics: Volume 225 (MRS Proceedings) ipod
Materials Reliability Issues in Microelectronics: Volume 225 (MRS Proceedings) download
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